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Note: This course is not available for the current semester.
Course No: 10.537; Last Offered: Summer 2015;
Course Description
This lecture course will provide an in-depth introduction to the principles, instrumentation and applications of most common nanomaterial characterization techniques. Nanomaterial imaging, physical, chemical, and optical property analyses are the main focus of this class. Topics covered will include: electron microscopy (SEM/TEM), scanned prove microscopy (AFM), elemental analysis (EDX/XPS), crystal structure analysis (XRD/SAED), thermal analysis (DSC/TGA), laser based characterization (LSCM/DLS/Raman), chromatographic methods (GC), infrared spectroscopy, UV/Vis spectroscopy and contact angle goniometry. The analytical and quantitative applications of these techniques for investigating different types of nanomaterials will also be described. Lab demonstrations will be included in lectures.
Prerequisites & Notes
- Prerequisites: Students with a CSCE or UGRD career need permission to take Graduate Level Courses.
- Special Notes:
- Credits: 3;
Questions About This Course?
Contact the Advising Center at 978-934-2474 or
Continuing_Education@uml.edu
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