Note: This course is not available for the current semester.
Course No: 24.541; Last Offered: No Data;
Introduction to the theory and practice of x-ray diffraction and atomic force microscope. Crystal structures and properties of crystalline materials are to be understood by x-ray diffractometer experiments. Surface topography or an atomic scale and force information can be obtained from atomic force microscope through interaction between specimen and the tips. Application of both XRD and AFM to advanced materials will be discussed.
Contact the Advising Center at 978-934-2474 or Continuing_Education@uml.edu
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